This system is a comprehensive performance verification platform designed for battery modules and complete battery packs (PACKs).

This system is a core equipment specifically designed for performance verification and quality evaluation of lithium battery cells. It can not only complete basic tests such as capacity, energy, and efficiency but also further support complex requirements in the process of cell R&D and production.

The High-Temperature Reverse Bias (HTRB) Aging Test System is a fundamental testing platform for evaluating the long-term insulation reliability and material stability of power devices. Applying continuous high reverse voltage to devices in a high-temperature environment, this severe condition accelerates the exposure of potential risks such as gate oxide defects, internal impurity ion migration, surface passivation layer failure, and packaging material degradation.

The High-Temperature Reverse Bias (HTRB) Aging Test System is a fundamental testing platform for evaluating the long-term insulation reliability and material stability of power devices. Applying continuous high reverse voltage to devices in a high-temperature environment, this severe condition accelerates the exposure of potential risks such as gate oxide defects, internal impurity ion migration, surface passivation layer failure, and packaging material degradation.

The High-Temperature High-Humidity Dynamic Reverse Bias (H3TRB) Aging Test System is specifically designed to simulate and accelerate the evaluation of reliability challenges faced by power semiconductor devices operating in humid environments. When temperature, humidity, and bias voltage coexist, they induce failure mechanisms unique to plastic-encapsulated devices: moisture penetrates through resin interfaces, causing electrolytic corrosion under the action of an electric field and leading to corrosion of metal leads; or it promotes the migration of impurity ions, resulting in increased leakage current and even short circuits.

The High-Temperature Dynamic Gate Bias (HTDGB) Aging Test System is a cutting-edge testing solution addressing the gate reliability challenges of modern power MOSFETs and IGBTs. As device switching speeds continue to increase (especially for wide-bandgap semiconductors), gates endure dynamic stresses such as voltage overshoot and ringing caused by high-speed switching in practical applications. This is more demanding for the robustness of gate oxide dielectrics and interface stability than static bias alone.

The DPQ300 solar cell PL/EL integrated tester is designed for defect detection of perovskite cells.

This 3D microscope uses confocal technology for non-contact 3D scanning, enabling micro-nano measurement and analysis of precision device surfaces.

The TAJ-106 PV Module Damp Heat Test Chamber is a professional environmental testing equipment launched by Wuhan Aijiang Technology.