PRODUCTS
SOLUTION
XINGHAN AI
Crystalline Silicon Production Line Testing Solution
● Full-Process Inspection Without Blind Spots
● Equipment Adaptable to Mainstream Production Lines
● Accurate and Traceable Data
● Compliance with National/International Standards
● Fast and Efficient Defect Recognition
● Support for Batch Quality Control
● Meeting Both Production and R&D Needs
● High Degree of Automation Integration
● Adaptable to Large-Size Battery Detection
● Helping Steadily Improve Yield Rate
Keyword:
Technology and Process
Solution Introduction
In the silicon wafer inspection link of the photovoltaic industry, we provide customers with high-quality configurable vision system solutions and vision components.
It detects defects such as hidden cracks, missing corners, edge chipping, and rice-shaped defects of silicon wafers generated during production and transportation, screens out defective wafers from the source, avoids waste in subsequent processing flows, improves the yield rate of battery cells, and saves significant costs.
According to different inspection precision requirements of customers, we offer different detection accuracies such as 2K and 4K. For example, our reflective components can magnify hidden crack defects of silicon wafers, perfectly meeting customers' high-precision inspection needs. According to different detection fields of view of customers, the working distance of each component is designed to be adjustable. Based on whether the on-site conveyor belt is partitioned or not, we have designed two lighting methods: transmissive and reflective. Our standardized products have covered various on-site needs of customers, and there are suitable products or mature detection schemes for various detection requirements proposed by customers.
In recent years, solar cells have been developing towards large sizes and thinner wafers. With this technological development trend, battery cells are more prone to hidden cracks and even breakage during the processing and production process; at the same time, some invisible defects (such as black spots, concentric circles, etc.) will also occur during the production of battery cells.
In response to this situation, Aijiang Technology has launched the battery cell PL imaging component, which can perform defect imaging of in-process battery cells and finished battery cells. Based on the principle of photoluminescence, the PL imaging component is a non-contact detection solution. While ensuring high-quality and high-speed imaging effects, it will not cause secondary hidden crack defects, effectively reducing the detection fragmentation rate. It has excellent imaging effects on defects such as hidden cracks, foggy blackening, suction cup marks, graphite boat marks, concentric circles, conveyor belt marks, black spots, and contamination in battery cells. The imaging component includes core parts such as a near-infrared line laser light source, a camera, and an infrared lens. The integrated structural design makes the product have the characteristics of high reliability, easy installation, simple debugging, and strong environmental adaptability.
Product List
● Solar Simulator
● Quantum Efficiency (QE) Tester
● Battery Cell Sorter
● Electroluminescence (EL) Detector
● Laser Interferometry Thickness Gauge
● High and Low Temperature Damp Heat Test Chamber
● Machine Vision Inspection System
● UV Aging Test Chamber
● Insulation Resistance Tester
Industrial Standard
● T/CPIA 0020-2020: Test Method for Electroluminescence of Crystalline Silicon Photovoltaic Cells
● T/CPIA 0099-2024: Boiling Test Method for Crystalline Silicon Photovoltaic Cells
● T/CSTM 00465-2022: Damp Heat Degradation Test Method for Crystalline Silicon Photovoltaic Cells
● T/CSTM 00461-2022: Electrode Peeling Strength Test Method for Crystalline Silicon Photovoltaic Cells
● T/CPIA 0041-2022: Thermal-Assisted Light-Induced Degradation Test Method for Crystalline Silicon Photovoltaic Cells
● GOST R IEC 61829-2013: Field Measurement of I-V Characteristics of Crystalline Silicon Photovoltaic Cells
● BS EN IEC 63202-1:2019: Photovoltaic Cells - Measurement of Light-Induced Degradation of Crystalline Silicon Photovoltaic Cells
● GB/T 9535: Design Qualification and Type Approval of Crystalline Silicon Photovoltaic Modules for Terrestrial Use
● IEC 61215: Performance Testing and Quality Certification Standards for Crystalline Silicon Photovoltaic Modules
● IEC 61730: Safety Certification Standards for Photovoltaic Modules
Keyword:
Customized service process
Contact Customer Service
Technical Communication
Design Proposal
Finalize The Plan
Start Production
Debugging Training
Delivery Acceptance
After-Sales Service
Component Equipment
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Contact Us
Add: Room 3513 World Trade Building No.686 Jiefang Ave Wuhan City China
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