Papua New Guinea Four-Probe Sheet Resistance Tester

PRODUCT INTRODUCTION

The Four-Probe Sheet Resistance Tester is a versatile, wide-range comprehensive measurement device based on the four-probe measurement principle. It also functions as a resistivity tester and conductivity tester. Designed in accordance with national standards for monocrystalline silicon physical testing methods and with reference to American ASTM standards, it is a specialized instrument for measuring the resistivity and sheet resistance of semiconductors and various other materials.

Adopting the dual-electrical measurement principle, the instrument performs multiple measurements to automatically eliminate the impact of factors such as sample geometry, boundary effects, probe unequal spacing, and mechanical drift on measurement results. Compared with single-electrical measurement, it significantly improves measurement accuracy and consistency.

Equipped with an optional USB flash drive data recording interface for convenient test data storage, the instrument comes standard with USB and RS232 interfaces for connection to computers. The supporting computer software enables intuitive full-function operation of the instrument, data recording, and easy electrical analysis of materials. With high measurement accuracy, good stability, high intelligence, simple operation, and intuitive test result display, it is widely used in semiconductor material factories, scientific research institutions, and universities for testing the electrical conductivity of various semiconductors, semiconductor-like materials, conductor materials, and new materials.

PRODUCT FEATURES

●  Maximum Resistance Accuracy: 0.05%; Minimum Resistance Resolution: 10μΩ

●  Maximum Sheet Resistance Accuracy: 3%; Minimum Sheet Resistance Resolution: 10μΩ

●  Temperature Compensation (TC) Function; Basic Temperature Accuracy: 0.1℃

●  Zero-Base Design: No need for zeroing when testing weak resistance

●  Presettable Test Piece Thickness: No need to refer to tables for resistivity testing

●  Dual-Electrical Measurement Mode: Corrects probe drift and sample edge effects

●  Synchronous Testing of Resistance/Sheet Resistance, Resistivity, Conductivity, Temperature, and Humidity

●  Remote Control via HANDLER/USB/RS232/RS485 Interfaces

●  Multiple Probes Optional: For measuring sheet resistance and resistivity of various characteristic materials

●  USB Flash Drive Data Recording and Remote Instrument Software Upgrade

●  Compliant with GB/T 1551-2009 and GB/T 1552-1995 Standards

●  Suitable for Measuring Semiconductors, Conductive Films, Metal/Nano Coatings, Solar Materials, Ceramics, etc.; Also Directly Measures Resistors

PARAMETER SPECIFICATIONS