Empowered by Future Energy Strategies: Aijiang Tech AMST Full-Scene Testing Accelerates Domestic Substitution of Power Semiconductors

The new energy industry is rapidly evolving toward higher voltage, larger current, and higher power density. As the fundamental core components of new energy systems, the authenticity, consistency, and stability of the static parameters of power semiconductors directly determine the operational efficiency, safety, and full-service life of new energy equipment.

With deep R&D expertise in precision testing technologies for the new energy sector, Aijiang Technology proudly launches the AMST Power Device Static Parameter Test System. Featuring ultra-high precision and full-scenario adaptability, this system delivers comprehensive static testing solutions for core new energy applications including wind power, photovoltaic, and energy storage. It precisely resolves the industry challenge of latent device failure and builds a robust testing foundation for the high-quality development of the new energy industry.

I. Full-Dimensional Coverage, One-Stop Solution for Full-Category & Full-Process Testing

Aijiang Tech’s AMST Power Semiconductor Static Parameter Test System breaks through the limitations of traditional test equipment in device type, manufacturing process, and application scenarios. It achieves three types of full coverage to fully meet the diverse testing needs of different users:

Full Scenario Coverage: Covers the entire spectrum from laboratory R&D and small-batch trial production to high-volume intelligent manufacturing production lines. It satisfies both high-precision testing demands in R&D and high-efficiency inspection requirements in mass production, enabling seamless connection between R&D and manufacturing.

Full Category Coverage：Perfectly adapts to next-generation wide-bandgap power semiconductors including Si IGBT, SiC MOS, and GaN HEMT, while fully supporting the testing of traditional power devices such as power diodes, MOSFETs, and BJTs. It provides a one-stop solution for multi-category device inspection.

Full Process Coverage：Covers the entire manufacturing chain from wafer-level, chip-level, and discrete device-level to module-level and even IPM intelligent power module testing, delivering accurate static parameter measurement throughout the full life cycle of power devices.

To match diverse testing scenarios, production capacities, and practical requirements, the system offers three customized models:

• Basic Model: For laboratory R&D and small-batch testing
• Semi-Automated Line Model: For medium-volume production, balancing efficiency and operational flexibility
• Fully Automated Line Model: For large-scale intelligent manufacturing, enabling unmanned, high-efficiency, and standardized testing

II. Core Features Precisely Matching Key Testing Needs in New Energy Application

High Voltage & High Current, Breaking Extreme Operating Condition Limits

The system delivers a maximum output voltage of 3,500 V (expandable to 10 kV) and a maximum output current of 6,000 A (via multi-module parallel connection), fully aligning with the high-power evolution of new energy equipment and easily handling device testing under extreme high-voltage and high-current conditions.

Ultra-High Precision Measurement for Critical Detail Control

Supports high-precision testing of nA-level leakage current and μΩ-level on-resistance, with 0.1% measurement accuracy and a 4-wire test scheme. It eliminates measurement deviations at the source, helps enterprises identify material defects and packaging risks in advance, and fundamentally mitigates latent failure risks.

Modular & Flexible Configuration for Future Upgrades

Adopts a modular design for flexible configuration of measurement units based on actual testing needs. The system reserves ample upgrade space, allowing later module expansion or replacement without full equipment replacement, significantly reducing enterprise equipment iteration costs.

Efficient & User-Friendly Operation for Improved Testing Throughput

Built-in dedicated switching matrix enables automatic circuit and measurement unit switching per test items. It supports one-key full-indicator testing in compliance with national standards, eliminating manual step-by-step debugging, greatly shortening single-device test cycles, and improving batch inspection efficiency.

Powerful Software System for Diverse Usage Scenarios

Equipped with dedicated host computer software featuring standard test templates for all categories of power devices for direct use. Supports real-time plotting of IV/CV curves, automatic data storage, and one-click Excel export for easy data management and traceability. Open standard SCPI command set allows seamless integration with MES, probe stations, and other third-party systems/equipment to meet intelligent production line requirements.

Superior Scenario Scalability Covering Full Testing Processes

Breaks through room-temperature testing limitations and supports full-temperature-range testing (ambient, high, and low temperatures). Customized test fixtures are available for different device packages. It can work in conjunction with probe stations, temperature chambers, and other third-party equipment, fully covering the entire testing process from R&D and selection to mass production of power devices.

Aijiang Power Semiconductor Testing Solution Portfolio

1. AMST Power Device Static Parameter Test System
2. AMDT Power Device Dynamic Parameter Test System
3. Power Cycling & Aging Test System
4. High-Temperature Reverse Bias (HTRB) Aging Test System
5. High-Temperature & High-Humidity Dynamic Reverse Bias (H3TRB) Aging Test System
6. High-Temperature Dynamic Gate Bias Aging Test System

III. Robust Product Advantages: Professional Testing to Mitigate Full-Process Engineering Risks

As a National High-Tech Enterprise, Aijiang Technology leverages profound technical accumulation in precision testing to develop the AMST Power Semiconductor Static Parameter Test System. With accurate and stable parameter measurement, it provides enterprises with a full-process engineering risk mitigation solution:

• Device Design Phase: Delivers authentic and reliable parameter data for R&D to avoid systemic design risks
• Device Selection Phase: Precisely identifies latent defects to prevent late-stage failures caused by improper selection
• Mass Production Phase: Enables standardized parameter inspection to ensure batch consistency
• Long-Term Equipment Operation Phase: Reduces failure rates caused by device issues at the source and cuts uncontrollable operation and maintenance costs

Each functional unit of the system features stable and reliable performance, with high-voltage, high-current, low-voltage, capacitance, and other full-dimensional testing capabilities meeting top industry standards. It precisely satisfies specialized testing needs in wind power, photovoltaic, energy storage, and other new energy segments, while fully supporting full-parameter inspection of various power semiconductor devices.

The system helps new energy equipment evolve from “usable” to “long-term stable, safe, and efficient”, truly building a core defense line for the high-quality development of the new energy industry.