Aijiang | Power Semiconductor Test Experts

Amid the booming development of the power semiconductor industry, post-packaging testing of power devices has become a critical step to ensure product quality and performance. Leveraging its profound technical accumulation and industry insights, Aijiang Technology has crafted a comprehensive and high-efficiency post-packaging testing solution for power semiconductor devices, providing solid support for the steady development of the power semiconductor industry.

Core Processes: Precision Control, Quality First

Post-packaging testing of power devices is a sophisticated, interlocking process. Aijiang Technology strictly adheres to this process, conducting all-round and in-depth inspections on every factory-shipped device in terms of electrical performance, reliability and safety, to ensure compliance with stringent industry standards and customer requirements.

Solution Overview: Integrated Innovation, Versatile Adaptation

Aijiang Technology's testing solution is a comprehensive system integrating Automated Test Equipment (ATE), automated handlers, high-temperature test units (Hot Chuck/Thermal Stream) and professional testing software. Tailored to the testing needs of different products such as IGBTs, MOSFETs, SiC/GaN devices and power modules, the solution adopts a modular configuration. It enables seamless connection from laboratory characteristic analysis to high-speed mass production testing, offering flexible and efficient testing approaches for power semiconductor enterprises.

Reference Standards: Authoritative Guidance, Standardized Testing

Aijiang Technology strictly follows a series of international and industrial authoritative standards for testing, including the JEDEC series (JESD22, JESD24, JESD51), AEC-Q101 stress test standard for automotive-grade power semiconductors, MIL-STD-750 test method standard for military semiconductor devices, AQG324 reliability test standard for electronic components in the automotive industry, IEC60747-8 and IEC60747-9 standards for discrete semiconductor devices, as well as IEDEC JEP173 dynamic resistance test method for GaN HEMTs. These standards provide a scientific and rigorous basis for testing, ensuring the accuracy and reliability of test results.

Core Products: Diverse Matrix, Demand-Oriented

Aijiang Technology boasts a full range of core testing products, including power semiconductor static parameter test systems, power semiconductor dynamic parameter test systems, power module cycle aging test systems, high-temperature reverse bias aging test systems, high-temperature high-humidity dynamic reverse bias aging test systems, and high-temperature dynamic gate bias aging test systems. These products work in synergy to form a complete testing matrix, capable of meeting the diverse testing needs of power semiconductors across different application scenarios.

Solution Advantages: All-Round Excellence, Growth-Enabling

1. High Precision & Full Coverage:The testing solution covers all-dimensional parameters from DC to dynamic, room temperature to high temperature, and performance to reliability, ensuring no testing blind spots and providing comprehensive quality assurance for power semiconductor devices.
2. High Efficiency & High Throughput: Adopting parallel testing technology and high-speed handlers, and optimizing the testing workflow, the solution greatly improves mass production testing efficiency, effectively reduces testing costs and helps enterprises enhance production efficiency.
3. High Reliability & Traceability: A stringent reliability screening process combined with a complete MES data traceability system delivers zero-defect quality assurance for customers. It is especially compliant with automotive-grade requirements, strengthening customers' confidence in product quality.
4. High Flexibility & Scalability: Modular design allows the solution to quickly adapt to the testing needs of new power devices (e.g., SiC, GaN) and new packaging forms (e.g., modules, plastic packaging), protecting customers' investment and providing strong support for enterprises' technological innovation and product upgrading.
5. One-Stop Service: Aijiang Technology offers end-to-end services from solution design, equipment integration and software development to commissioning, personnel training and technical support. This helps customers quickly establish and optimize their testing capabilities, reducing their time and effort input in the testing process.

Star Product: PMST Power Device Static Parameter Test System

1) Product Introduction

The PMST Power Device Static Parameter Test System is one of Aijiang Technology's core products, mainly composed of test instruments, host computer software, a computer, matrix switches, fixtures, and high-voltage & high-current signal lines. The entire system adopts a self-developed static test host with built-in measurement units of various voltage and current grades. All voltage and current measurement units inside the host feature a multi-range design with a test accuracy of up to 0.1%.

The gate-emitter unit supports a maximum pulsed current output and test of 30V @ 10A, enabling accurate testing of leakage current as low as pA level. The collector-emitter unit supports a maximum high-speed pulsed current of 6000A with a typical rise time of 15μs, and is equipped with a high-speed voltage synchronous sampling function. The system supports a maximum voltage output of 3500V with a built-in leakage current measurement function.

Capacitance characteristic testing includes input capacitance, output capacitance and reverse transfer capacitance testing, with a maximum supported frequency of 1MHz. Module configuration can be selected on demand to meet the diverse testing needs of different customers.

2) Product Features

1. High Voltage & High Current: With a maximum voltage of 3500V (scalable to 10kV) and a maximum current of 6000A (multi-module parallel connection), it meets high-power testing requirements.
2. High-Precision Measurement: Enables nA-level leakage current and μΩ-level on-resistance measurement with an accuracy of 0.1%. Four-wire testing eliminates interference.
3. Modular Flexibility: Measurement units can be configured on demand with reserved upgrade space for easy subsequent addition or upgrade.
4. High Testing Efficiency: A dedicated switch matrix enables automatic switching and supports one-click testing of all national standard indicators, shortening test time.
5. Comprehensive Software Functions: Comes with built-in test templates, supports curve plotting, automatic data saving and export, and an open SCPI command set.
6. Excellent Scalability: Supports multi-temperature zone testing, customizable fixtures, and linkage with third-party equipment such as probe stations and temperature chambers.

3) Product Parameters