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High-Temperature Reverse Bias (HTRB) Aging Test System


The High-Temperature Reverse Bias (HTRB) Aging Test System is a fundamental testing platform for evaluating the long-term insulation reliability and material stability of power devices. Applying continuous high reverse voltage to devices in a high-temperature environment, this severe condition accelerates the exposure of potential risks such as gate oxide defects, internal impurity ion migration, surface passivation layer failure, and packaging material degradation.


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High-Temperature Reverse Bias (HTRB) Aging Test System

Product Introduction


The High-Temperature Reverse Bias (HTRB) Aging Test System is a fundamental testing platform for evaluating the long-term insulation reliability and material stability of power devices. Applying continuous high reverse voltage to devices in a high-temperature environment, this severe condition accelerates the exposure of potential risks such as gate oxide defects, internal impurity ion migration, surface passivation layer failure, and packaging material degradation.

Integrating a high-stability high-voltage power supply, a precision temperature-controlled environmental chamber, and a picoampere-level weak current detection circuit, the system can maintain stable temperature and voltage stresses for an extended period (usually hundreds to thousands of hours). Its core lies in accurately monitoring subtle changes in the leakage current of devices under high-voltage stress (e.g., Iceo for IGBTs, Idss for MOSFETs), which are often early signs of device performance degradation.

The system supports multi-channel parallel testing, greatly improving test throughput and the statistical significance of data. Whether used for evaluating new structures and materials in the R&D phase, or for quality consistency screening and reliability certification in the mass production phase, HTRB testing is an indispensable link to verify whether devices can operate "silently" and reliably under high-voltage and high-temperature environments.


Product Features


●  Precise High-Voltage Application: Adopts a low-ripple high-voltage DC power supply combined with dynamic voltage compensation technology to ensure the stability and accuracy of the reverse bias voltage (Vds or Vce) during long-term testing.

●  High-Temperature Uniformity Control: The high-temperature chamber adopts a multi-zone heating and forced air circulation design, achieving a uniformity of ≤±2℃ within the operating temperature range (up to 200℃) and avoiding measurement errors caused by thermal gradients.

●  Weak Current Detection: Equipped with a high-resolution picoammeter, it can accurately measure leakage currents (Idss/Ic) ranging from nA to mA, with automatic range switching and drift compensation functions.

●  Multi-Channel Synchronous Testing: Supports up to 64 channels of parallel testing. Each channel features independent power supply, monitoring, and protection, and is equipped with a high-voltage matrix switching system to increase test capacity.

●  Safety Interlock Mechanism: Equipped with door access switches, emergency power-off, and gas fire extinguishing interfaces. The high-voltage area is physically isolated from the operating area, meeting the adaptation requirements of CLASS 10000 clean environments.

Product Parameters


Item

Parameters

Reverse Bias Voltage

DC 0 ~ 3000V / 6000V (optional)

Voltage Stability

≤±0.5% F.S. (Full Scale)

Leakage Current Measurement Range

1pA ~ 100mA

High-Temperature Chamber Temperature Range

Room temperature +10℃ ~ 200℃

Temperature Uniformity

≤±2℃ @150℃

Number of Test Channels

16/32/64/128 (optional)

Data Sampling Interval

1 second ~ 24 hours (configurable)


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