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PMST Power Device Static Parameter Test System
1：High-precision measurement: nA-level leakage current, μΩ-level on-resistance; 0.1% accuracy measurement; four-wire testing； 2：Modular configuration: Various measurement units can be flexibly configured according to actual test needs; the system reserves upgrade space, and measurement units can be added or upgraded later； 3：High test efficiency: Built-in dedicated switch matrix for automatic switching of circuits and measurement units according to test items; supports one-key testing of all national standard indicators；
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PMST Power Device Static Parameter Test System
The PMST Power Device Static Parameter Test System is mainly composed of test instruments, upper computer software, a computer, a matrix switch, fixtures, high-voltage and high-current signal lines, etc. The entire system adopts an independently developed static test host, which is built with multiple measurement units of different voltage and current levels. All the voltage and current measurement units inside the PMST Power Device Static Parameter Test System host adopt a multi-range design, with a test accuracy of 0.1%. Among them, the gate-emitter (GE) supports a maximum of 30V@10A pulse current output and testing, and can measure leakage current as low as pA level; the collector-emitter (CE) supports a maximum of 6000A high-speed pulse current with a typical rise time of 15μs, and is equipped with a high-voltage synchronous sampling function; it supports a maximum voltage output of 3500V and has a built-in leakage current measurement function. Capacitance characteristic testing includes input capacitance, output capacitance, and reverse transfer capacitance testing, with a maximum supported frequency of 1MHz, and module configuration can be selected as needed.
- High voltage and large current: Equipped with high-voltage measurement/output capability, with a voltage of up to 3500V (maximum expandable to 10kV); equipped with large-current measurement/output capability, with a current of up to 6000A (multi-module parallel connection)
- High-precision measurement: nA-level leakage current, μΩ-level on-resistance; 0.1% accuracy measurement; four-wire testing
- Modular configuration: Various measurement units can be flexibly configured according to actual test needs; the system reserves upgrade space, and measurement units can be added or upgraded later
- High test efficiency: Built-in dedicated switch matrix for automatic switching of circuits and measurement units according to test items; supports one-key testing of all national standard indicators
- Rich software functions: The upper computer comes with standard device parameter test item templates that can be directly retrieved and used; supports curve plotting; automatically saves test data and supports export in EXCEL format; open standard SCPI command set for integration with third-party systems
- Good expandability: Supports normal temperature, low-temperature, and high-temperature testing; can flexibly customize various fixtures; can be used in conjunction with third-party equipment such as probe stations and temperature chambers
| Item | Parameters | |
| High-Voltage Test Unit | Accuracy | ±0.1% |
| Maximum voltage | 3500V, upgradeable to 10kV | |
| Typical high-voltage rise time | <5ms | |
| Leakage current test range | 1nA~100mA | |
| High-Current Test Unit | Accuracy | ±0.1% |
| Maximum current | 1000A, expandable to 6000A via parallel connection | |
| Typical high-current rise time | <15μs | |
| High-current pulse width | 50μs~500μs | |
| Low-Voltage Test Unit | Accuracy | ±0.1% |
| Maximum voltage | 300V | |
| Maximum current | 1A (DC) / 10A (pulse) | |
| Minimum voltage range | 300mV | |
| Minimum test leakage current | 10pA | |
| Minimum pulse width | 200μs | |
| Capacitance Test Unit | Basic test accuracy | ±0.5% |
| Frequency range | 10Hz~1MHz | |
| Capacitance range | 0.01pF-9.9999F | |
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