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Power Cycling Aging Test System
The High-Temperature Reverse Bias (HTRB) Aging Test System is a fundamental testing platform for evaluating the long-term insulation reliability and material stability of power devices. Applying continuous high reverse voltage to devices in a high-temperature environment, this severe condition accelerates the exposure of potential risks such as gate oxide defects, internal impurity ion migration, surface passivation layer failure, and packaging material degradation.
Keyword:
Power Cycling Aging Test System
Product Introduction
The Power Cycling Aging Test System is a core equipment for evaluating the lifespan and reliability of power semiconductor devices. In modern power electronic applications, power modules are subjected to frequent current switching and drastic temperature changes. The resulting mismatch in thermal expansion coefficients can lead to key failure modes such as solder layer fatigue, bonding wire detachment, and chip warpage.
Adopting industry-leading active power cycling technology, this system accurately simulates thermomechanical stresses under real operating conditions. By integrating a low-inductance high-current loop, a high-speed response power supply, and a high-precision junction temperature monitoring module, the system can apply repeatable and quantifiable accelerated stresses to samples such as IGBTs, SiC MOSFETs, GaN HEMTs, and full-bridge modules under set temperature difference (ΔTj), maximum junction temperature (Tjmax), and cycling frequency.
Beyond focusing on the classic number of cycles to failure (Nf), the system can deeply analyze failure mechanisms by online monitoring the degradation trajectory of key parameters such as saturation voltage drop and thermal resistance. It provides critical data support for chip design optimization, packaging process improvement, and lifespan model establishment, making it an indispensable verification tool for ensuring the long-term stable operation of automotive-grade and industrial-grade power modules.
Product Features
● Precise Temperature Control and Monitoring: Adopts a low-inductance high-current loop design and Joule heating (self-heating) method. Combined with high-precision infrared thermography or TSEP online temperature calibration technology, it achieves real-time, non-intrusive precise control and measurement of junction temperature (Tj).
● Multi-Stress Composite Capability: Supports independent programming of multiple parameters including ΔTj, Tjmax, on-time, cycle period, and load current. Capable of performing active (A-PC) and passive (P-PC) power cycling tests.
● Intelligent Failure Judgment: Integrates an online monitoring module to real-time capture drifts of key parameters such as saturation voltage drop (Vce(sat)/Vds(on)), thermal resistance (Rth), and threshold voltage. Configurable failure thresholds trigger automatic alarm and shutdown.
● Modularity and High Throughput: Supports multi-station parallel testing (e.g., 16+ stations), with each station independently controlled. Equipped with quick-plug DUT (Device Under Test) fixtures to improve test efficiency and equipment utilization.
● Big Data Analysis Platform: Comes with professional software that automatically records cycle count, temperature curves, and parameter degradation data. Generates Weibull lifespan distribution analysis reports and supports fitting of lifespan models such as Coffin-Manson.
Product Parameters
|
Item |
Parameters |
|
Current Output Range |
DC 100A ~ 5000A (multiple ranges optional) |
|
Voltage Monitoring Accuracy |
±0.1% F.S. (Full Scale) |
|
Junction Temperature Control Range |
40℃ ~ 200℃ (ΔTj up to 150K) |
|
Junction Temperature Measurement Accuracy |
±2℃ or ±1% (whichever is larger) |
|
Cycle Period |
0.5s ~ 300s (programmable) |
|
Maximum Parallel Stations |
16/32/64 (optional) |
|
Communication Interfaces |
Ethernet, GPIB, RS-232 |
|
Safety Protection: |
Dual hardware protection against overcurrent, overvoltage, overtemperature, and DUT open/short circuit |
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Add: Room 3513 World Trade Building No.686 Jiefang Ave Wuhan City China
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